Avadain’s prototyping has demonstrated patented graphene technology which reliably produces large, thin and very few defect graphene flakes using a batch process.
EXFOLIATION EFFICIENCY
- X-Ray Diffraction (XRD) is one of the most promising tools to characterize the material
- Signal of graphitic layer stacking almost gone after expansion
- Strong indication for a high exfoliation efficiency
COMPARISON OF FLAKE DEFECTS
Each peak on the spectra line tells us something about the material. Starting on the left, the small peak, called the D peak, refers to how many defects are in the material. The Company 2 flakes have a lot of defects, which can be seen by the large peak. The Avadain flakes have very few defects, which is shown by how small the peak is.
RAMAN SPECTROSCOPY: Ratio of the D to the G Peak Area
The D peak in Raman spectra is an indication of defects in the material. The ratio of its intensity compared to the intensity of the graphite/graphene G peak indicates the defect density. Below are histograms of the D/G ratio of µ-Raman mappings.
FLAKE THICKNESS
Raman spectroscopy: 2D band symmetry
Raman spectroscopy of the 2D band can be used as a measure for the layer number. The higher the symmetry of the 2D band (assessed by the “coefficient of determination” of a single-peak-fitting), the thinner the flakes.
For more technical information:
Click Here to review US Patent #10,662,537